High resolution X-ray diffractometry and topography | 三重大学附属図書館 OPAC

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High resolution X-ray diffractometry and topography

フォーマット:

図書

責任表示:

D. Keith Bowen and Brian K. Tanner

言語:

英語

出版情報:

London : Taylor & Francis, c1998

形態:

x, 252 p. ; 26 cm

著者名:

書誌ID:

BA39292928

ISBN:

9780850667585 [0850667585]

子書誌情報

所蔵情報

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詳細

資料形態(詳細):	Text
主題:	Crystals; X-ray crystallography; X-rays--Diffraction
LCCN:	98136331
注記:	Includes bibliographical references and index
登録日:	1999-02-24
分類・件名:	LCC : QD945 DDC : 548/.83 LCSH : X-ray crystallography LCSH : X-rays -- Diffraction LCSH : Crystals

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