1.

図書
図書
1. High resolution X-ray diffractometry and topography
D. Keith Bowen and Brian K. Tanner
出版情報: London : Taylor & Francis, c1998
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2.

図書
図書
2. Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]
edited by Brian K. Tanner and D. Keith Bowen
出版情報: New York, N.Y. : Plenum Press, c1980
シリーズ名: NATO advanced study institutes series ; ser. B . Physics ; v. 63
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