Annual proceedings, reliability physics

タイトル、所在を表示します

Annual proceedings, reliability physics

フォーマット:

雑誌

責任表示:

Reliability Physics Symposium ; IEEE Electron Devices Group ; IEEE Reliability Group

言語:

英語

出版情報:

New York, N.Y. : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971-c1993

形態:

v. ; 28 cm

著者名:

ISSN:

07350791

巻次年月次:

8th (Apr. 7/10, 1970)-31st (Mar. 23/24/25, 1993)

継続後誌:

IEEE international reliability physics proceedings / sponsored by the IEEE Electronic Devices Society and the IEEE Reliability Society <AA11059226>

書誌ID:

AA11024425

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

その他のタイトル:	Reliab. phys Reliability physics
資料形態(詳細):	Text
刊行状態:	Dead status
刊行頻度:	Annual
主題:	Electronic apparatus and appliances--Reliability--Congresses; Electronic apparatus and appliances--Testing--Congresses; Integrated circuits--Reliability--Congresses; Integrated circuits--Testing--Congresses
LCCN:	82640313
変遷ファミリーID:	40781500
注記:	Sponsored by: the IEEE Electron Device Group and the IEEE Reliability Group
登録日:	1998-08-31
分類・件名:	LCSH : Electronic apparatus and appliances -- Reliability -- Congresses LCSH : Electronic apparatus and appliances -- Testing -- Congresses LCSH : Integrated circuits -- Reliability -- Congresses LCSH : Integrated circuits -- Testing -- Congresses

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