Particle beam microanalysis : fundamentals, methods, and applications

タイトル、所在を表示します

フォーマット:

図書

責任表示:

E. Fuchs, H. Oppolzer, H. Rehme

言語:

英語

出版情報:

Weinheim ; New York : VCH, c1990

形態:

xviii, 507 p. ; 25 cm

著者名:

書誌ID:

BA11878316

ISBN:

9783527268849 [3527268847] (: gw)
9780895735058 [0895735059] (: us)

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

資料形態(詳細):	Text
主題:	Electron microscopy--Industrial applications; Materials--Microscopy
LCCN:	90012865
注記:	Includes bibliographical references and index
登録日:	1991-05-15
分類・件名:	LCC : TA417.23 DDC : 620.1/127 LCSH : Materials -- Microscopy LCSH : Electron microscopy -- Industrial applications

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1 図書 Molecular beam epitaxy : fundamentals and current status Herman, Marian A., Sitter, Helmut Springer	7 図書 Methods of organic elemental microanalysis Ingram, Gerald Reinhold
2 図書 Introduction to cryptography : principles and applications Delfs, Hans, Knebl, Helmut Springer	8 図書 Basic methods of organic microanalysis Klimova, Valentina A., Rosinkin, Alexander Mir
3 図書 Electrochemical methods : fundamentals and applications Bard, Allen J., Faulkner, Larry R., 1944- John Wiley	9 図書 Atomic and molecular beam methods Scoles, Giacinto Oxford University Press
4 図書 The meaning of focus particles : a comparative perspective König, Ekkehard, 1941- Routledge	10 図書 Padé approximation and its applications, Bad Honnef 1983 : proceedings of a conference held at Bad Honnef, Germany, March 7-10, 1983 Werner, Helmut, 1931-, Bünger, Hans Josef, 1946- Springer-Verlag
5 図書 Charged particle beams Humphries, Stanley Wiley	11 図書 Materials fundamentals of molecular beam epitaxy Tsao, Jeffrey Y. Academic Press
6 雑誌 Laser and particle beams Cambridge University Press	12 図書 High-resolution electron microscopy for materials science 進藤, 大輔(1953-), 平賀, 賢二(1939-) Springer-Verlag